Embedded Boundary-scan Testing
نویسندگان
چکیده
Boundary-Scan testing is used more and more to overcome many of the testability issues facing today’s higher density designs. In the past, Boundary-Scan has been used successfully with ATE’s and external PC based test systems. Since Boundary-Scan tests are structural in nature, they can be reused with often minor modifications in the embedded arena. Further, these same tests can be used in the H/W design lab, S/W development lab, EST chambers, functional test, factory system test, field test, and repair center test. We present cases, within Lucent Technologies, where this has been successfully achieved for many Wireline and Wireless product families. This paper also discusses the mechanisms used to achieve these successes.
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